El. Shirley et al., Modeling final-state interaction effects in inelastic X-ray scattering from solids: resonant and non-resonant, J ELEC SPEC, 114, 2001, pp. 939-946
Citations number
48
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences
Journal title
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA
We present resonant inelastic X-ray scattering calculations that realistica
lly incorporate intermediate-state electron-core hole interactions and fina
l-state electron-valence hole interactions. Intermediate-state interactions
primarily affect the total fluorescence yield, whereas final-state interac
tions can change the relative strengths of spectral emission features. This
is especially true in systems with strong valence-hole exciton effects. We
also consider non-resonant excitation of core electrons. This work conside
rs resonant scattering from B Is electrons in cubic boron nitride (cBN) and
hexagonal boron nitride (hBN) and non-resonant scattering from Mg and O Is
electrons in MgO, and compares theoretical results to experiment. (C) 2001
Elsevier Science B.V; All rights reserved.