Modeling final-state interaction effects in inelastic X-ray scattering from solids: resonant and non-resonant

Citation
El. Shirley et al., Modeling final-state interaction effects in inelastic X-ray scattering from solids: resonant and non-resonant, J ELEC SPEC, 114, 2001, pp. 939-946
Citations number
48
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences
Journal title
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA
ISSN journal
03682048 → ACNP
Volume
114
Year of publication
2001
Pages
939 - 946
Database
ISI
SICI code
0368-2048(200103)114:<939:MFIEII>2.0.ZU;2-1
Abstract
We present resonant inelastic X-ray scattering calculations that realistica lly incorporate intermediate-state electron-core hole interactions and fina l-state electron-valence hole interactions. Intermediate-state interactions primarily affect the total fluorescence yield, whereas final-state interac tions can change the relative strengths of spectral emission features. This is especially true in systems with strong valence-hole exciton effects. We also consider non-resonant excitation of core electrons. This work conside rs resonant scattering from B Is electrons in cubic boron nitride (cBN) and hexagonal boron nitride (hBN) and non-resonant scattering from Mg and O Is electrons in MgO, and compares theoretical results to experiment. (C) 2001 Elsevier Science B.V; All rights reserved.