Resonant magnetic X-ray scattering from ultrathin Ho-metal films down to afew atomic layers

Authors
Schussler-Langeheine, C Weschke, E Grigoriev, AY Ott, H Meier, R Vyalikh, DV Mazumdar, C Sutter, C Abernathy, D Grubel, G Kaindl, G
Citation
C. Schussler-langeheine et al., Resonant magnetic X-ray scattering from ultrathin Ho-metal films down to afew atomic layers, J ELEC SPEC, 114, 2001, pp. 953-957
Citations number
19
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences
Journal title
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA
ISSN journal
03682048 → ACNP
Volume
114
Year of publication
2001
Pages
953 - 957
Database
ISI
SICI code
0368-2048(200103)114:<953:RMXSFU>2.0.ZU;2-X
Abstract
The magnetic structure of ultrathin He-metal films grown on W(110) was stud ied by resonant magnetic X-ray scattering at the L, and M, resonances. For Ho films down to 14 monolayer (ML) thickness, a bulk-like helical antiferro magnetic structure is observed. For a 10-ML thick film, an altered magnetic structure and enhanced layer spacing is found. (C) 2001 Elsevier Science B N. All rights reserved.