Polarization dependence of the soft X-ray raman scattering at the L edge of TiO2

Citation
Y. Harada et al., Polarization dependence of the soft X-ray raman scattering at the L edge of TiO2, J ELEC SPEC, 114, 2001, pp. 969-973
Citations number
3
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences
Journal title
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA
ISSN journal
03682048 → ACNP
Volume
114
Year of publication
2001
Pages
969 - 973
Database
ISI
SICI code
0368-2048(200103)114:<969:PDOTSX>2.0.ZU;2-0
Abstract
Polarization dependence of the soft X-ray Raman scattering was investigated at the Ti 2p absorption edge of TiO2. Strong Raman scattering features app ear about 14 eV below elastic peaks with strong polarization dependence. Th ese Raman scattering structures are charge transfer excitations to the anti bonding state between 3d(1)(L) under bar and 3d(0) states, because they are enhanced when the incident photon energies are tuned at satellite structur es of Ti 2p absorption spectrum. Broad Raman scattering structures are foun d between 3 eV and 10 eV below elastic peaks. They show weak polarization d ependence and are assigned to be nonbonding type charge transfer excitation s. (C) 2001 Elsevier Science B.V. All rights reserved.