Citation
K. Wetzig et al., TEM-EELS investigations of nanoscale multilayers in the linescan mode, J ELEC SPEC, 114, 2001, pp. 1019-1023
Citations number
6
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences
Journal title
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA
ISSN journal
03682048
→ ACNP
Volume
114
Year of publication
2001
Pages
1019 - 1023
Database
ISI
SICI code
0368-2048(200103)114:<1019:TIONMI>2.0.ZU;2-H
Abstract
Nanoscale multilayers have microstructural and compositional properties whi
ch may differ widely from those of bulk materials. Such changes were invest
igated by EELS in the analytical TEM for different binary multilayer system
s. Nanoscale Co/Cu multilayers showed a chemical mixing depending on the pr
eparation technique. A trend to demixing was observed at annealing. The fin
e structure of the O-K edge on nanoscale Fe/Al layers enables the localized
distinction between, O bonding at Fe and Al. (C) 2001 Elsevier Science B.V
. All rights reserved.