V-shaped beams are widely applied for the suspension of the sensors, fiber
holders, and the suspension arms of atomic force microscopes. The performan
ce of the V-shaped beam is highly dependent upon its initial out-of-plane d
eflection. This paper reports on the exploration of the out-of-plane deform
ation of V-shaped micromachined beams. A finite element model has been esta
blished to predict the deformation of a V-shaped micromachined beam. The fa
brication and characterization of various shapes of SiO2 V-shaped micromach
ined beams has been performed to observe the out-of-plane deformation cause
d by residual stress. With the difference between the analytical and experi
mental results, an etching process dependent mechanism has been discussed.
Thus the design criteria to fabricate a flat V-shaped beam is accomplished.