Divergent laser illumination is commonly used in current designs of commerc
ial electronic speckle pattern shearing interferometry (ESPSI) or shearogra
phy, for qualitative non-destructive testing (NDT) of material defects. The
growing demand for quantitative out-of-plane (OOP) and more recently in-pl
ane (IP) ESPSI, is determining the quality of optical system design and ana
lysis software. However, little attention is currently being given to under
standing, quantifying and compensating for the numerous error sources. Data
describing the measurement inaccuracy due to the divergence of the object
illumination wavefront for an OOP interferometer is presented. The errors a
re measured by comparing divergent object illumination with collimated illu
mination, with respect to illumination angle, lateral shear and shearing di
rection. Results indicate that the magnitude of the relative error increase
s by approximately a power function as the distance from the illumination s
ource decreases.