Structural and optical properties of Fe1-xMxSi2 thin films (M = Co, Mn; 0 <= x <= 0.20)

Authors
Fanciulli, M Zenkevich, A Weyer, G Vanzini, C Tresso, E Baricco, M
Citation
M. Fanciulli et al., Structural and optical properties of Fe1-xMxSi2 thin films (M = Co, Mn; 0 <= x <= 0.20), MICROEL ENG, 55(1-4), 2001, pp. 233-241
Citations number
22
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
MICROELECTRONIC ENGINEERING
ISSN journal
01679317 → ACNP
Volume
55
Issue
1-4
Year of publication
2001
Pages
233 - 241
Database
ISI
SICI code
0167-9317(200103)55:1-4<233:SAOPOF>2.0.ZU;2-F
Abstract
The influence on the structural and optical properties of Co or Mn alloying in beta -FeSi2 has been investigated by X-ray diffraction (XRD), conversio n electron Mossbauer spectroscopy (CEMS), mu -Raman spectroscopy, and trans mittance measurements. Fe1-xMxSi2 thin films (M = Co, Mn; 0 < x < 0.20) wer e produced by co-deposition at room temperature of Fe and Co or Mn onto Si( 001) substrates using the pulsed laser deposition (PLD) technique and in-si tu annealing at 700 degreesC. (C) 2001 Elsevier Science B.V. All rights res erved.