Roughness effects on the electrical conductivity of thin films grown in a quasi-layer-by-layer mode - art. no. 125404

Citation
G. Palasantzas et Jtm. De Hosson, Roughness effects on the electrical conductivity of thin films grown in a quasi-layer-by-layer mode - art. no. 125404, PHYS REV B, 6312(12), 2001, pp. 5404
Citations number
28
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICAL REVIEW B
ISSN journal
01631829 → ACNP
Volume
6312
Issue
12
Year of publication
2001
Database
ISI
SICI code
0163-1829(20010315)6312:12<5404:REOTEC>2.0.ZU;2-#
Abstract
We investigate morphology effects on the electrical conductivity on thin se miconducting and metallic films grown in a quasi-layer-by-layer growth mode within the framework of quantum-mechanical electron transport theory. The film growth mode is described by a nonequilibrium Sine-Gordon model that in corporates evaporation/lecondensation, surface diffusion, and lattice pinni ng effects. For semiconducting films, pinning effects manifest themselves a s oscillations superimposed on a smoothly increasing conductivity with grow th time. For metallic films, quantum size effect oscillations are strongly convoluted with pinning induced oscillations, which dominate the conductivi ty variations at later stages of growth.