The use of the amphoteric nature of impurity silicon atoms for obtaining planar p-n junctions on GaAs (111)A substrates by molecular beam epitaxy

Citation
Gb. Galiev et al., The use of the amphoteric nature of impurity silicon atoms for obtaining planar p-n junctions on GaAs (111)A substrates by molecular beam epitaxy, SEMICONDUCT, 35(4), 2001, pp. 415-418
Citations number
10
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
SEMICONDUCTORS
ISSN journal
10637826 → ACNP
Volume
35
Issue
4
Year of publication
2001
Pages
415 - 418
Database
ISI
SICI code
1063-7826(2001)35:4<415:TUOTAN>2.0.ZU;2-Y
Abstract
Epilayers of the n- and p-type were grown. It is demonstrated that the surf ace relief of the p-type layers is inferior to that of n-type layers. Howev er, in both cases, the photoluminescence spectra and charge carrier mobilit y have no considerable distinctions from these characteristics for single-c rystal samples. Planar p-n junctions were obtained, and diodes were fabrica ted as well. Depending on the layer structure, the current-voltage characte ristics for devices take a form typical of conventional or inverted diodes. (C) 2001 MAIK "Nauka/Interperiodica".