Extraction of coupling ratios for Fowler-Nordheim programming conditions

Citation
R. Duane et al., Extraction of coupling ratios for Fowler-Nordheim programming conditions, SOL ST ELEC, 45(2), 2001, pp. 235-242
Citations number
13
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Eletrical & Eletronics Engineeing
Journal title
SOLID-STATE ELECTRONICS
ISSN journal
00381101 → ACNP
Volume
45
Issue
2
Year of publication
2001
Pages
235 - 242
Database
ISI
SICI code
0038-1101(200102)45:2<235:EOCRFF>2.0.ZU;2-7
Abstract
An analysis of extinction methodologies for the coupling ratios in non-vola tile memories using numerical simulation is presented. The floating gate vo ltage of a non-volatile memory (NVM) cell cannot be accessed directly from measurements but can he derived using numerical simulation techniques. In t his paper, various coupling ratio methodologies from literature are investi gated using numerical simulation techniques and guidelines on improving the application of those methods to NVM cells are outlined. Measurements are p erformed which validate the increased accuracy of the methods and some of t he improved methodologies are recommended for coupling ratio extraction in the Fowler Nordheim regime. This work demonstrates the role of numerical si mulation in supplementing the electrical characterisation of NVM cells. (C) 2001 Elsevier Science Ltd, All rights reserved.