Depth profile and quantitative trace element analysis of diffusion aluminided type layers on Ni-base superalloys using high-resolution glow-dischargemass spectrometry

Trace elemental compositions of platinum-aluminide (PtAl) coatings and thei r depth profiles on nickel base superalloys were studied using high-resolut ion glow discharge mass spectrometry. Concentration profiles for selected t race elements were investigated from the near-surface regions down to more than 100 microns. The conventional conversion procedure of ion intensities vs. sputtering rime into concentration vs. depth was evaluated and correcte d with the necessary correction factors. To ensure validity, the roughness of the sputtered craters, crater walls and the nature of the re-deposited m aterials on the periphery of the craters were inspected. (C) 2001 Elsevier Science B.V. All rights reserved.