Characterization of excimer lasers for application to lenslet array homogenizers

Citation
Y. Lin et al., Characterization of excimer lasers for application to lenslet array homogenizers, APPL OPTICS, 40(12), 2001, pp. 1931-1941
Citations number
24
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Optics & Acoustics
Journal title
APPLIED OPTICS
ISSN journal
00036935 → ACNP
Volume
40
Issue
12
Year of publication
2001
Pages
1931 - 1941
Database
ISI
SICI code
0003-6935(20010420)40:12<1931:COELFA>2.0.ZU;2-6
Abstract
We investigate the best method of characterizing high-divergence lasers, su ch as excimer lasers, to suppress fine-scale intensity nonuniformity that i s due to coherence effects of lenslet homogenizers. We show by a detailed a nalysis of the lenslet homogenizer that, for highest accuracy, a direct mea surement of the value of the autocorrelation function should be made at the separation p of the lenslet elements, identified as the critical spatial p eriod. We show that the commonly used characterization of lasers by the 1/e (2) width of the angular divergence is not the most accurate test and may o verstate or understate the effectiveness of a given laser. (C) 2001 Optical Society of America.