A self-arrayed poly(styrene-co-hydroxyethylmethacrylate) film surface was e
xamined using microscope techniques possessing microchemical capabilities,
together with standard (control) techniques. Secondary electron (SEI) and b
ackscattered electron (BEI) images obtained in a field-emission scanning mi
croscope, as well as scanning atomic force (AFM) and electric potential (SE
PM) images, show an accumulation of hydrophobic particles around point and
line macrocrystal defects. Defects in self-arrayed latex films are thus lar
gely due to latex particle chemical heterogeneities. This result is consist
ent with the capillary adhesion-dependent models for macrocrystal formation
and it shows the importance of latex purification, prior to macrocrystalli
zation. (C) 2001 Elsevier Science B.V. All rights reserved.