Chip cap flaws investigated

Authors
Carbone, R Adams, T
Citation
R. Carbone et T. Adams, Chip cap flaws investigated, ELECTRON W, 107(1781), 2001, pp. 330-332
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
ELECTRONICS WORLD
ISSN journal
09598332 → ACNP
Volume
107
Issue
1781
Year of publication
2001
Pages
330 - 332
Database
ISI
SICI code
0959-8332(200105)107:1781<330:CCFI>2.0.ZU;2-H