Mr. Werner et Wr. Fahrner, Review on materials, microsensors, systems, and devices for high-temperature and harsh-environment applications, IEEE IND E, 48(2), 2001, pp. 249-257
The considerable investment in silicon technology has rarely addressed devi
ce use in harsh environments such as high temperatures, aggressive media, a
nd radiation exposure. A clear future requirement is to save weight, volume
, and reduce costs in "unfriendly" environments like high temperatures. Thi
s can be achieved either by cooling systems or by electronic microsystem co
mponents suited to withstand high temperatures. The current status of cooli
ng systems, harsh-environment sensors, and microsystems in view of markets,
realized devices, material, properties, process maturity, and packaging te
chnologies will be reviewed. Possible semiconductor candidates for high-tem
perature applications are being discussed. The main obstacles for the futur
e of high-temperature and harsh-environment microsystems will be highlighte
d.