Lifetime measurements by photoconductance techniques in wafers immersed ina passivating liquid

Lifetime measurement procedures with transient photoconductance decay and q uasi-steady-state photoconductance techniques for wafers immersed in a pass ivating liquid are presented in this paper, in situ calibration methods are proposed based on the comparison between the output of both techniques on the same sample. Precautions concerning the handling of the passivating liq uid are described. Resolution of the electron and hole lifetimes is perform ed in a set of samples. (C) 2001 The Electrochemical Society.