Citation
Jh. Kim et al., Thickness dependence of the melting temperature of thin polymer films, MACRO RAPID, 22(6), 2001, pp. 386-389
Citations number
17
Categorie Soggetti
Organic Chemistry/Polymer Science
Journal title
MACROMOLECULAR RAPID COMMUNICATIONS
ISSN journal
10221336
→ ACNP
Volume
22
Issue
6
Year of publication
2001
Pages
386 - 389
Database
ISI
SICI code
1022-1336(20010405)22:6<386:TDOTMT>2.0.ZU;2-1
Abstract
Communication: The melting temperature (Tm,) of thin poly[ethylene-co-(viny
l acetate)] films coated on a silicon wafer was investigated. Ellipsometry
was used to measure the Tm,which was found to decrease dramatically when th
e thickness of the film is less than 300 Angstrom. The relationship between
the lamellar thickness and the Tm, was thought to be responsible this thic
kness dependence of the Tm, in thin polymer films.