Consumption-related development in microelectroforming

Citation
Nn. Issaev et al., Consumption-related development in microelectroforming, MICROSYST T, 7(1), 2001, pp. 44-46
Citations number
12
Categorie Soggetti
Instrumentation & Measurement
Journal title
MICROSYSTEM TECHNOLOGIES
ISSN journal
09467076 → ACNP
Volume
7
Issue
1
Year of publication
2001
Pages
44 - 46
Database
ISI
SICI code
0946-7076(200103)7:1<44:CDIM>2.0.ZU;2-Y
Abstract
High-aspect ratio microelectroforming is one of the most challenging techni ques in MEMS microfabrication. This is particularly true with plating metal into the very tall micropatterned polymer molds made by X-ray lithography for primary or secondary metal structures or metal mold inserts within the framework of the LIGA process. Among various problems are: (1) the time con sumption in plating very tall parts or using microelectroplating as a repli cation technique; (2) the cost of material, in particular in the formation of very high-aspect-ratio absorber structures for X-ray masks in the deep a nd ultradeep X-ray lithography step.