Electronic structure and charge transfer in 3C-and 4H-SiC

Citation
Gl. Zhao et D. Bagayoko, Electronic structure and charge transfer in 3C-and 4H-SiC, NEW J PHYS, 2, 2000, pp. 161-1612
Citations number
53
Categorie Soggetti
Physics
Journal title
NEW JOURNAL OF PHYSICS
ISSN journal
13672630 → ACNP
Volume
2
Year of publication
2000
Pages
161 - 1612
Database
ISI
SICI code
1367-2630(20000718)2:<161:ESACTI>2.0.ZU;2-0
Abstract
We utilized a local density functional potential, the linear combination of atomic orbital (LCAO) method, and the BZW procedure to study the electroni c structure of 3C- and 4H-SiC. We present the calculated energy bands, band -gaps, effective masses of n-type carriers, and critical point transition e nergies. There is good agreement between the calculated electronic properti es and experimental results. Our preliminary total energy calculations for 3C-SiC found an equilibrium lattice constant of a = 4.35 , which is in agre ement with the experimentally measured value of 4.348 . The calculated char ge transfers indicate that each silicon atom loses about 1.4 electrons that are gained by a carbon atom in both 3C- and 4H-SiC.