Optical properties of wide band gap indium sulphide thin films obtained byphysical vapor deposition

Citation
N. Barreau et al., Optical properties of wide band gap indium sulphide thin films obtained byphysical vapor deposition, PHYS ST S-A, 184(1), 2001, pp. 179-186
Citations number
21
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH
ISSN journal
00318965 → ACNP
Volume
184
Issue
1
Year of publication
2001
Pages
179 - 186
Database
ISI
SICI code
0031-8965(20010315)184:1<179:OPOWBG>2.0.ZU;2-E
Abstract
Thin films of indium sulphide containing oxygen have been synthesized follo wing a dry physical process. The constituents are deposited by thermal evap oration on glass substrates and then annealed under argon flow. Polycrystal line beta -In2S3 containing oxygen thin films are obtained as soon as the t emperature of annealing is between 623 and 723 K. In this paper, these beta -In2S3 thin films have optically been studied. The optical band gap is dir ect. Its value is not dependent on the temperature of annealing. It is abou t 2.8 eV, which is higher than that of beta -In2S3 single crystal. This hig h value is related to the presence of oxygen in the films. The extinction c oefficient ii and the refractive index n of the films have also been found independent of the annealing temperature. These optical properties make the films studied good candidates to be substituted to CdS in Cu(In,Ga)Se-2 ba sed solar cells.