New paradigm of silicon technology

Citation
T. Ohmi et al., New paradigm of silicon technology, P IEEE, 89(3), 2001, pp. 394-412
Citations number
53
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
PROCEEDINGS OF THE IEEE
ISSN journal
00189219 → ACNP
Volume
89
Issue
3
Year of publication
2001
Pages
394 - 412
Database
ISI
SICI code
0018-9219(200103)89:3<394:NPOST>2.0.ZU;2-C
Abstract
dWe present a new paradigm of Si technologies to establish a gigahertz-oper ation gigascale integrated system large-scale integration (LSI), including digital and analog circuits. According to the theoretical analysis of high- speed signal propagation properties in the practical LSI structure, a gas-i solated-interconnect high-k gate di-electric metal-gate metal-substrate sil icon-on-insulator (SOI) LSI structure is proposed as a possible solution fo r a future gigahertz GSI system LSI, where the clock rate is improved up to beyond 10 Ghz and the minimum feature size is reduced down to 0.035 mum wi th keeping a continuous progress of the LSI's speed performance. Perfect sc ientific manufacturing free from fluctuations consisting of total low-tempe rature high-quality and high-speed processes based on very high-density pla sma having very low electron temperatures is essential to realize them.