Electron ionisation induced fragmentation of fused norbornene analogues containing SiMe2 or GeMe2 and oxygen bridges. Migration of SiMe2 and GeMe2 groups

The main electron ionisation induced fragmentation processes of fused norbo rnene analogues containing SiMe2 or GeMe2 and oxygen bridges, as well as th eir dependence on substitution, were investigated using mass (MS) and tande m mass (MS/MS) spectrometric analysis. Formation of the rearrangement ions of m/z 176 in the mass spectra of fused norbornene analogues containing SiM e2 and m/z 222 in the mass spectrum of norbornene analogues containing GeMe 2 provides firm evidence for the migration of a SiMe2 and GeMe2 bridge, res pectively. Copyright (C) 2001 John Wiley & Sons, Ltd.