AUTOMATIC DEFORMATION ANALYSIS IN ELECTRONIC SPECKLE PATTERN INTERFEROMETRY USING ONE SPECKLE INTERFEROGRAM OF DEFORMED OBJECT

We propose a new fringe analysis method that uses only one speckle int erferogram of a deformed object to obtain phase change distribution by deformation. This method uses cos(-1) operations to extract absolute, not signed, values of new phase after deformation. Considering the ph ase changes in a small local area, true phase changes retain almost th e same value by assuming a continuous deformation in the area. This re tention determines the sign of the new phase. From the new phase and t he initial phase, the phase change distribution by the deformation can be obtained. Experimental results show the usefulness of this method.