Influence of buffer layer and TCO deposition on the bulk properties of chalcopyrites

Authors
Luck, I Storkel, U Bohne, W Ennaoui, A Schmidt, M Schock, HW Braunig, D
Citation
I. Luck et al., Influence of buffer layer and TCO deposition on the bulk properties of chalcopyrites, THIN SOL FI, 387(1-2), 2001, pp. 100-103
Citations number
8
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
THIN SOLID FILMS
ISSN journal
00406090 → ACNP
Volume
387
Issue
1-2
Year of publication
2001
Pages
100 - 103
Database
ISI
SICI code
0040-6090(20010529)387:1-2<100:IOBLAT>2.0.ZU;2-D
Abstract
The formation of the electrically active interface of chalcopyrite based so lar cells in the course of the buffer layer and TCO deposition was studied by photoluminescence, X-ray photoelectron spectroscopy and elastic recoil d etection analysis. Changes in absorber properties, namely defect chemistry and composition, were observed after each buffer and TCO deposition step. A fter the completed cell processing a strong intermixing between absorber, b uffer and TCO material in the interface region was found. (C) 2001 Elsevier Science B.V. All rights reserved.