Comments on ultra-high-resolution STEM

The resolution of an image in a scanning transmission electron microscope m ay he improved if an image of the specimen is recorded for each point in th e nanodiffraction pattern. It is shown that the method suggested by Rodenbu rg et al. (Ultramicroscopy 48 (1993) 304) may serve as the basis for an exp erimentally feasible scheme in which a resolution of better than 0.1 nm is achieved for regions of 1 nm diameter chosen from normal STEM images. (C) 2 001 Elsevier Science B.V. All rights reserved.