Coated silica tips for use in high-pressure, high-temperature, scanning tunneling microscopy

Authors
Weeks, BL Barber, ZH Raval, M Welland, ME Rayment, T
Citation
Bl. Weeks et al., Coated silica tips for use in high-pressure, high-temperature, scanning tunneling microscopy, ULTRAMICROS, 87(1-2), 2001, pp. 19-23
Citations number
22
Categorie Soggetti
Multidisciplinary,"Spectroscopy /Instrumentation/Analytical Sciences
Journal title
ULTRAMICROSCOPY
ISSN journal
03043991 → ACNP
Volume
87
Issue
1-2
Year of publication
2001
Pages
19 - 23
Database
ISI
SICI code
0304-3991(200103)87:1-2<19:CSTFUI>2.0.ZU;2-Y
Abstract
A novel application of coated silica tips for use in high-pressure, high-te mperature. scanning tunneling microscopy is introduced. Thermal drift is re duced in the Z-direction due to the low thermal expansion of silica. Virtua lly, any conducting material that can be evaporated or sputtered can be use d as a tip material. Experimental results are shown for tips sputter coated with platinum, along with images obtained. (C) 2001 Elsevier Science B.V. All rights reserved.