An algorithm was developed that allows a theoretical step-by-step study of
secondary target XRF setups for different combinations of anode materials,
secondary targets and operating tube voltages. By use of three different de
scriptions of x-ray tube spectral distributions, the qualitative and quanti
tative characteristics of the x-ray beam after the secondary target are exa
mined. Calculations are presented for different combinations of anode mater
ial and secondary target such as Y-Mo, Mo-Mo, Rh-Mo and W-Mo. Additionally,
universal functional relationships of the secondary target characteristic
line intensities with respect to the operational voltage are presented. The
se relationships can be applied to any XRF setup that includes an x-ray dif
fraction tube and a secondary target. Copyright (C) 2001 John Wiley & Sons,
Ltd.