Theoretical study of a secondary target XRF setup at different operationaltube voltages

Citation
C. Zarkadas et al., Theoretical study of a secondary target XRF setup at different operationaltube voltages, X-RAY SPECT, 30(2), 2001, pp. 99-109
Citations number
30
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences
Journal title
X-RAY SPECTROMETRY
ISSN journal
00498246 → ACNP
Volume
30
Issue
2
Year of publication
2001
Pages
99 - 109
Database
ISI
SICI code
0049-8246(200103/04)30:2<99:TSOAST>2.0.ZU;2-E
Abstract
An algorithm was developed that allows a theoretical step-by-step study of secondary target XRF setups for different combinations of anode materials, secondary targets and operating tube voltages. By use of three different de scriptions of x-ray tube spectral distributions, the qualitative and quanti tative characteristics of the x-ray beam after the secondary target are exa mined. Calculations are presented for different combinations of anode mater ial and secondary target such as Y-Mo, Mo-Mo, Rh-Mo and W-Mo. Additionally, universal functional relationships of the secondary target characteristic line intensities with respect to the operational voltage are presented. The se relationships can be applied to any XRF setup that includes an x-ray dif fraction tube and a secondary target. Copyright (C) 2001 John Wiley & Sons, Ltd.