Lithium diffusion in cerium-vanadium mixed oxide thin films: a systematic study

Citation
F. Varsano et al., Lithium diffusion in cerium-vanadium mixed oxide thin films: a systematic study, ELECTR ACT, 46(13-14), 2001, pp. 2069-2075
Citations number
20
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
ELECTROCHIMICA ACTA
ISSN journal
00134686 → ACNP
Volume
46
Issue
13-14
Year of publication
2001
Pages
2069 - 2075
Database
ISI
SICI code
0013-4686(20010402)46:13-14<2069:LDICMO>2.0.ZU;2-D
Abstract
Three electroanalytical techniques have been used to study the solid-state ionic diffusion of lithium into cerium-vanadium mixed oxide thin films, i.e . potentiostatic intermittent titration technique, galvanostatic intermitte nt titration technique and electrochemical impedance spectroscopy. Diffusio n coefficients measured with the above mentioned techniques show a non-mono tonic decay between 8 x 10(-12) and g x 10(-14) cm(2) s(-1). In particular, lithium diffusion coefficient drops by mon than one order of magnitude at lithium intercalation degree x = 0.6. This abrupt change seems to be relate d to a dramatic increase of the material resistance suggesting that the lim iting factor in atomic lithium diffusion may be the low electronic conducti vity. (C) 2001 Elsevier Science Ltd. All rights reserved.