Compton profile study of bonding in ZnTe

Citation
Y. Sharma et al., Compton profile study of bonding in ZnTe, I J ENG M S, 7(5-6), 2000, pp. 274-277
Citations number
23
Categorie Soggetti
Engineering Management /General
Journal title
INDIAN JOURNAL OF ENGINEERING AND MATERIALS SCIENCES
ISSN journal
09714588 → ACNP
Volume
7
Issue
5-6
Year of publication
2000
Pages
274 - 277
Database
ISI
SICI code
0971-4588(200010/12)7:5-6<274:CPSOBI>2.0.ZU;2-D
Abstract
The Compton profile of semiconductor compound ZnTe is presented in this wor k. The measurement has been made using 5 Ci Am-241 Compton spectrometer. Th e measurement is compared with the theoretical profiles calculated for vari ous ionic arrangements of ZnTe: The behaviour of valence electrons of ZnTe is also discussed in terms of equal-valence-electron-density profiles of it s isovalent compound namely, CdTe. It is observed that the chemical bonding in ZnTe is more covalent than in CdTe, well in agreement with available re sults.