Mq. Ye et Cp. Grigoropoulos, Time-of-flight and emission spectroscopy study of femtosecond laser ablation of titanium, J APPL PHYS, 89(9), 2001, pp. 5183-5190
Femtosecond laser ablation of titanium has been studied via time-of-flight
(TOF) and emission spectroscopy measurement. Laser pulses of 80 fs full wid
th at half maximum at lambda =800 nm were delivered by a Ti:sapphire femtos
econd laser system. A vacuum chamber with a base pressure of 10(-7) Torr wa
s built for ion TOF measurement. These ion TOF spectra were utilized to det
ermine the velocity distribution of the ejected ions. While nanosecond lase
r ablation typically generates ions of tens of eV, femtosecond laser irradi
ation even at moderate energy densities were found to produce energetic ion
s with energies in the range of a few keV. Two ablation regimes, exhibiting
different laser fluence dependence of the total ion yields, and the corres
ponding percentage of energetic ions and the crater depth, were identified
and explained on the basis of the two-temperature model. Clean craters were
observed by interferometric microscope measurements, indicating the advant
ages of and potential for applying femtosecond lasers to micromachining and
advanced materials treatment. Emission spectroscopy and imaging have been
carried out via a monochromator and an intensified CCD camera. Femtosecond
laser-induced plumes were found to be much smaller and weaker in intensity
than those induced by nanosecond laser pulses. (C) 2001 American Institute
of Physics.