Time-of-flight and emission spectroscopy study of femtosecond laser ablation of titanium

Citation
Mq. Ye et Cp. Grigoropoulos, Time-of-flight and emission spectroscopy study of femtosecond laser ablation of titanium, J APPL PHYS, 89(9), 2001, pp. 5183-5190
Citations number
22
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF APPLIED PHYSICS
ISSN journal
00218979 → ACNP
Volume
89
Issue
9
Year of publication
2001
Pages
5183 - 5190
Database
ISI
SICI code
0021-8979(20010501)89:9<5183:TAESSO>2.0.ZU;2-J
Abstract
Femtosecond laser ablation of titanium has been studied via time-of-flight (TOF) and emission spectroscopy measurement. Laser pulses of 80 fs full wid th at half maximum at lambda =800 nm were delivered by a Ti:sapphire femtos econd laser system. A vacuum chamber with a base pressure of 10(-7) Torr wa s built for ion TOF measurement. These ion TOF spectra were utilized to det ermine the velocity distribution of the ejected ions. While nanosecond lase r ablation typically generates ions of tens of eV, femtosecond laser irradi ation even at moderate energy densities were found to produce energetic ion s with energies in the range of a few keV. Two ablation regimes, exhibiting different laser fluence dependence of the total ion yields, and the corres ponding percentage of energetic ions and the crater depth, were identified and explained on the basis of the two-temperature model. Clean craters were observed by interferometric microscope measurements, indicating the advant ages of and potential for applying femtosecond lasers to micromachining and advanced materials treatment. Emission spectroscopy and imaging have been carried out via a monochromator and an intensified CCD camera. Femtosecond laser-induced plumes were found to be much smaller and weaker in intensity than those induced by nanosecond laser pulses. (C) 2001 American Institute of Physics.