Surface oxidation as a diffusion barrier for Al deposited on ferromagneticmetals

Citation
Wf. Egelhoff et al., Surface oxidation as a diffusion barrier for Al deposited on ferromagneticmetals, J APPL PHYS, 89(9), 2001, pp. 5209-5214
Citations number
24
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF APPLIED PHYSICS
ISSN journal
00218979 → ACNP
Volume
89
Issue
9
Year of publication
2001
Pages
5209 - 5214
Database
ISI
SICI code
0021-8979(20010501)89:9<5209:SOAADB>2.0.ZU;2-X
Abstract
Grazing incidence x-ray reflectometry has been used to study surface oxidat ion as a diffusion barrier for Al deposited on ferromagnetic metals (Co, Fe , Ni, and Ni80Fe20). Samples of the form SiO2\ 10 nm X \4 nm Al with X =(Co , Fe, Ni, and Ni80Fe20) were investigated for X \ Al intermixing. Surface o xidation was achieved by exposing the ferromagnetic layer to O-2 to oxidize the top two or three atomic layers before depositing the Al layer. Specula r x-ray scans were used for the analysis. Samples of the form SiO2\ 10 nm X \4 nm Au were used to separate topographical roughness from intermixing. S urface oxidation was found to suppress the diffusion of Al into Co, Ni, and Ni80Fe20 but not into Fe. (C) 2001 American Institute of Physics.