Optical properties of InGaAs quantum dots formed on InAlAs wetting layer

Citation
Yc. Zhang et al., Optical properties of InGaAs quantum dots formed on InAlAs wetting layer, J CRYST GR, 224(1-2), 2001, pp. 41-46
Citations number
24
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
JOURNAL OF CRYSTAL GROWTH
ISSN journal
00220248 → ACNP
Volume
224
Issue
1-2
Year of publication
2001
Pages
41 - 46
Database
ISI
SICI code
0022-0248(200104)224:1-2<41:OPOIQD>2.0.ZU;2-R
Abstract
We have fabricated a new self-assembled quantum dot system where InGaAs dot s are formed on InAlAs wetting layer and embedded in GaAs matrix. The low-t emperature photoluminescence and atomic force microscopy measurements confi rm the realization of the structure. In contrast to traditional InAs/Ga(Al) As quantum dots, the temperature dependence of the photoluminescence of the dots in such a structure exhibits an electronically decoupled feature due to a higher energy level of the wetting layer which keeps the dots more iso lated from each other. (C) 2001 Published by Elsevier Science B.V.