U. Woggon et al., ELECTRON-MICROSCOPIC AND OPTICAL INVESTIGATIONS OF THE INDIUM DISTRIBUTION GAAS CAPPED INXGA1-XAS ISLANDS, Applied physics letters, 71(3), 1997, pp. 377-379
Results from a structural and optical analysis of buried InxGa1-xAs is
lands carried out after the process of GaAs overgrowth are presented.
It is found that during the growth process, the indium concentration p
rofile changes and the thickness of the wetting layer emanating from a
Stranski-Krastanow growth mode grows significantly. Quantum dots are
formed due to strong gradients in the indium concentration, which is d
emonstrated by photoluminescence and excitation spectroscopy of the bu
ried InxGa1-xAs islands. (C) 1997 American Institute of Physics.