Dw. Onstad et al., Modeling the dynamics of adaptation to transgenic corn by western corn rootworm (Coleoptera : Chrysomelidae), J ECON ENT, 94(2), 2001, pp. 529-540
A simulation model of the population dynamics and genetics of the western c
orn rootworm, Diabrotica virgifera virgifera LeConte, was created for a lan
dscape of corn, soybean, and other crops. Although, the model was created t
o study a 2-locus problem for beetles having genes for resistance to both c
rop rotation and transgenic cool, during this first phase of tile project,
the model was simulated to evaluate only resistance management plans for tr
ansgenic corn. Allele expression in the rootworm and toxin dose in the corn
plant were the two most important factors affecting resistance development
. A dominant resistance allele allowed quick evolution of resistance to tra
nsgenic corn, whereas a recessive allele delayed resistance >99 yr. With hi
gh dosages of toxin and additive expression, the time required to reach 3%
resistance allele frequency ranged from 13 to >99 yr. With additive express
ion, lon er dosages permitted tire resistant allele frequency to reach 3% i
n 2-9 yr with refuges occupying 5-30% of the land. The results were sensiti
ve to delays in emergence by susceptible adults and configuration of the re
fuge (row strips versus blocks).