AFM study of topographical changes on aluminum surfaces in sulfuric acid under low current anodic dissolution

Citation
Tm. Nabi et al., AFM study of topographical changes on aluminum surfaces in sulfuric acid under low current anodic dissolution, J ELEC CHEM, 501(1-2), 2001, pp. 33-40
Citations number
27
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences
Journal title
JOURNAL OF ELECTROANALYTICAL CHEMISTRY
ISSN journal
15726657 → ACNP
Volume
501
Issue
1-2
Year of publication
2001
Pages
33 - 40
Database
ISI
SICI code
Abstract
A study of the anodic dissolution of polycrystalline aluminum utilizing in- situ atomic force microscopy (AFM) is reported. Terraced pyramidal walls wi th a constant characteristic width of 300-400 nm running relatively paralle l to each other appear within a few minutes of dissolution. Upon further di ssolution, these pyramidal walls are reduced to square terraced pyramids or ziggurats of constant width. AFM contour and profile plots reveal the extr emely square and flat surfaces of the square plateaus on top of the ziggura ts, all of them having the same size. Tinder the dissolution conditions uti lized, nucleation occurs at dislocation sites with primarily layer-by-layer dissolution. A long-range interaction between approaching dissolution fron ts decreases the dissolution rate leaving the terraced pyramidal walls. Thi s interaction is interpreted to arise from band bending in the oxidic layer existing on the surface. These features suggest that a strong role in the dissolution kinetics is played by the non-local potentials caused by the el ectronic charge and band bending on the oxide layer. The terracing of the w alls is believed to result from a short-range or chemical dissolution effec t. Possible applications of these prepared surfaces are also discussed. (C) 2001 Elsevier Science B.V. All rights reserved.