J. He et al., X-RAY-ABSORPTION AND PHOTOELECTRON SPECTROSCOPIC OBSERVATION OF INTRAZEOLITIC SILICON NANOCLUSTERS, Chemical communications, (14), 1997, pp. 1265-1266
The Si-K near-edge absorption spectra and X-ray photoelectron spectra
of silicon nanoclusters encapsulated in the pores of zeolite Y are mea
sured; the intrazeolitic Si clusters display a blue shift of the K-edg
e (0.5 eV) relative to that of bulk Si and a strong room-temperature p
hotoluminescence, which is consistent with the quantum confinement eff
ect; the number of Si in the as-prepared sample is estimated to be 20
atoms per unit cell of zeolite Y from both XPS and Si K NEXAFS analysi
s.