X-RAY-ABSORPTION AND PHOTOELECTRON SPECTROSCOPIC OBSERVATION OF INTRAZEOLITIC SILICON NANOCLUSTERS

Citation
J. He et al., X-RAY-ABSORPTION AND PHOTOELECTRON SPECTROSCOPIC OBSERVATION OF INTRAZEOLITIC SILICON NANOCLUSTERS, Chemical communications, (14), 1997, pp. 1265-1266
Citations number
23
Categorie Soggetti
Chemistry
Journal title
ISSN journal
13597345
Issue
14
Year of publication
1997
Pages
1265 - 1266
Database
ISI
SICI code
1359-7345(1997):14<1265:XAPSOO>2.0.ZU;2-K
Abstract
The Si-K near-edge absorption spectra and X-ray photoelectron spectra of silicon nanoclusters encapsulated in the pores of zeolite Y are mea sured; the intrazeolitic Si clusters display a blue shift of the K-edg e (0.5 eV) relative to that of bulk Si and a strong room-temperature p hotoluminescence, which is consistent with the quantum confinement eff ect; the number of Si in the as-prepared sample is estimated to be 20 atoms per unit cell of zeolite Y from both XPS and Si K NEXAFS analysi s.