Raman spectra of Na2Si2O5 in solid and liquid states from room temperature
to 1773 K were measured to observe phase transition and analyze the tempera
ture-dependent variations of the structure units, five kinds of SiO4 tetrah
edrons, which are defined as Q(4), Q(3), Q(2), Q(1) and Q(0) species corres
ponding to the number of bridging oxygen binding to each Si. A pulsed coppe
r vapor laser was used as laser source coupled with time resolved detection
system to eliminate the dense thermal emission background while temperatur
e was >1273 K. Temperature-dependent Raman spectra can clearly indicate mel
ting point of a crystal around 1143 K. Gaussian deconvolutions of complex s
tretching vibrational bands of crystal and amorphous states (glass and liqu
id) were described. Raman sensitivity factors were introduced to calculate
the mole fractions of the different SiO4 tetrahedrons. There is a decrease
of Q(3) species and an increase of Q(4) and Q(2) species with increasing te
mperature. And after melting, the ratio of the components remain unchanged.
Q(3) species decomposes again after about 1573 K. More Q(n) species would
form with increasing temperature. Although the Q(n) distribution of the gla
ss is similar to that of the liquid of melting temperature, T-m similar to
1143 K, the liquid structure has a greater disorder than that of the glass.
(C) 2001 Published by Elsevier Science B.V.