The use of INAA and IPAA is illustrated by several applications (Zn-traces
in Cu, neutron doping of Zn in copper, implanted Sb in silicon, trace eleme
nts in sediment material and polyethylene). The two methods are used to com
plement or to cross-check each other. Validation by IDA-TIMS was performed
in the case of neutron doping and turned out to be a valuable support. Even
developed routines of activation analysis need improvement. Two technical
solutions, the high energy photon screen (HEPS) and a twin detector assembl
y, are dealt with in detail.