Characteristic analysis for a TiT target using nuclear reactions

Citation
Gd. Kim et al., Characteristic analysis for a TiT target using nuclear reactions, J KOR PHYS, 38(4), 2001, pp. 299-304
Citations number
15
Categorie Soggetti
Physics
Journal title
JOURNAL OF THE KOREAN PHYSICAL SOCIETY
ISSN journal
03744884 → ACNP
Volume
38
Issue
4
Year of publication
2001
Pages
299 - 304
Database
ISI
SICI code
0374-4884(200104)38:4<299:CAFATT>2.0.ZU;2-6
Abstract
It is found that the T-3(p,n)He-3 reaction changes the concentration profil e of a TiT thin film, which is a MeV neutron target, owing to proton irradi ation of a few coulomb. The concentrations in the TiT thin film, including the areal densities of Ti and T, were estimated by using several analytical methods, such as He Rutherford backscattering, proton Rutherford backscatt ering, and elastic recoil detection time of flight, and by measuring total neutron cross-sections of C-12 and O-16 before and after T-3(p,n)He-3 react ion. The respective areal densities of T and Ti in the TiT thin film were 3 .8 x 10(18) particles/cm(2) and 1.3 x 10(19) particles/cm(2) after several T-3(p,n)He-3 reactions, and these values, which were obtained by several an alytical methods, coincided within 5%. These results were compared with the data provided by the target-producing company.