Thermal etching effects on InGaN/GaN and GaN/AlGaN quantum well structuresduring metalorganic chemical vapor deposition

Citation
Sc. Choi et al., Thermal etching effects on InGaN/GaN and GaN/AlGaN quantum well structuresduring metalorganic chemical vapor deposition, J KOR PHYS, 38(4), 2001, pp. 413-415
Citations number
12
Categorie Soggetti
Physics
Journal title
JOURNAL OF THE KOREAN PHYSICAL SOCIETY
ISSN journal
03744884 → ACNP
Volume
38
Issue
4
Year of publication
2001
Pages
413 - 415
Database
ISI
SICI code
0374-4884(200104)38:4<413:TEEOIA>2.0.ZU;2-W
Abstract
Tile in-situ thermal etching effect during metalorganic chemical vapor depo sition of InGaN/GaN and GaN/AlGaN quantum Reil (QW) structures has been stu died. Tile InGaN and tile GaN were seriously etched by thermal decompositio n in the InGaN/GaN and the GaN/AlGaN quantum well structures. Tile transmis sion electron microscope image showed that tile InGaN/GaN QW layers were th ermally etched as the substrate temperature was increased after QW growth. Also, tile GaN/AlGaN emission peak was blue-shifted with increasing growth interruption time at the heterointerfaces, which was related to tile therma l etching effect.