Atomic force microscopy investigation of polystyrene and polystyrene/PMMA composites surfaces

The surface morphology of polystyrene (PS) before and after u.v.-irradiatio n was studied by means of Atomic Force Microscopy (AFM). The u.v.-irradiati on of PS sample doped with poly(methyl methacrylate) caused distinct change s in surface morphology. The nanometer-scale structures of the rod-like sha pe bumps of diameter of 300 nm and the height of 75 nm were created. We als o showed that the very small forces of 0.2 nN are enough high to modify the surface of PS samples.