I. Kink et al., Analysis of broadband x-ray spectra of highly charged krypton from a microcalorimeter detector of an electron-beam ion trap - art. no. 046409, PHYS REV E, 6304(4), 2001, pp. 6409
Spectra of highly charged Kr ions, produced in an electron-beam ion trap (E
BIT), have been recorded in a broad x-ray energy band (0.3 keV to 4 keV) wi
th a microcalorimeter detector. Most of the spectral lines have been identi
fied as transitions of B- to Al-like Kr. The transition energies have been
determined with 0.2% uncertainty. A semi-empirical EBIT plasma model has be
en created to calculate a synthetic spectrum of highly charged Kr and to de
termine a charge state distribution of Kr ions inside the EBIT.