An exchangeable Si wafer internal reflection element for FT-IR measurementof water sample

Citation
M. Seyama et al., An exchangeable Si wafer internal reflection element for FT-IR measurementof water sample, SENS ACTU-B, 74(1-3), 2001, pp. 54-59
Citations number
21
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences","Instrumentation & Measurement
Journal title
SENSORS AND ACTUATORS B-CHEMICAL
ISSN journal
09254005 → ACNP
Volume
74
Issue
1-3
Year of publication
2001
Pages
54 - 59
Database
ISI
SICI code
0925-4005(20010415)74:1-3<54:AESWIR>2.0.ZU;2-E
Abstract
A lipophilic-layer-coated Si internal reflection element (SRE) is reported as an exchangeable probe for Fourier-transform infrared spectroscopic measu rement of organic contaminants in water. The SRE is installed in the reflec tion cell by being stacked on a light-guiding crystal. The lipophilic layer is a self-assembled layer made from octadecyltrichlorosilane. We theoretic ally and experimentally confirmed that the cell comprising the SRE placed o n a ZnSe-light-guiding crystal could measure n-hexane dispersed in water. ( C) 2001 Elsevier Science B.V. All rights reserved.