Polarization-resolved output analysis of X-ray multiple-wave interaction

The polarization suppression of the interfering components in X-ray multipl e-wave interaction is observed for the first time by using a polarization a nalyzer with an arbitrary inclination of the diffraction plane with respect to that of the investigated crystal. The condition for total suppression o f the multiple-wave interaction outside the investigated crystals by a pola rization analyzer is derived theoretically from the modified Born approxima tion. By means of the partial suppression of the strong interfering compone nt, the increase in the visibility of multiple-wave interference is experim entally and theoretically demonstrated. The proposed experimental polarizat ion-resolved technique provides an operational way to enhance the visibilit y of X-ray multiple-wave interaction outside the investigated crystals for direct phase determination.