Kinetics of buckling of a compressed film on a viscous substrate

Citation
N. Sridhar et al., Kinetics of buckling of a compressed film on a viscous substrate, APPL PHYS L, 78(17), 2001, pp. 2482-2484
Citations number
9
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
78
Issue
17
Year of publication
2001
Pages
2482 - 2484
Database
ISI
SICI code
0003-6951(20010423)78:17<2482:KOBOAC>2.0.ZU;2-8
Abstract
Compressively-stressed elastic films on finite-thickness viscous substrates can undergo a buckling instability that relieves stresses but destroys the planarity of the film. A linear-stability analysis is performed to determi ne the onset and maximally unstable mode of this buckling instability as a function of misfit strain, viscous layer thickness, and viscosity. We find that the onset of the buckling instability of the film on a glass layer is the same as that for a compressively stressed free-standing film. However, the maximally unstable wavelength increases as the glass layer thickness in creases. Comparisons with experimental data are provided. (C) 2001 American Institute of Physics.