Nanoscale fracture studies using the scanning force microscope

Citation
B. Baumeister et al., Nanoscale fracture studies using the scanning force microscope, APPL PHYS L, 78(17), 2001, pp. 2485-2487
Citations number
19
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
78
Issue
17
Year of publication
2001
Pages
2485 - 2487
Database
ISI
SICI code
0003-6951(20010423)78:17<2485:NFSUTS>2.0.ZU;2-1
Abstract
We present a variety of experiments concerning friction and fracture mechan isms using two-dimensional arrays of microfabricated nanotowers as template s. The scanning force microscope tip is used as a tool to apply well-define d forces to the surface of the patterned substrate. Force statistic measure ments reveal information about the forces involved in the fracture process and the probability of fracture of selected towers. These methods are discu ssed in the context of nanometer-scale mechanisms. Using optimized paramete rs, a controlled removal of individual nanotowers and the ability to "write " predefined patterns on a nanometer scale can be achieved. (C) 2001 Americ an Institute of Physics.