Low-temperature scanning probe microscopy of surface and subsurface charges

Authors
Vogel, M Stein, B Pettersson, H Karrai, K
Citation
M. Vogel et al., Low-temperature scanning probe microscopy of surface and subsurface charges, APPL PHYS L, 78(17), 2001, pp. 2592-2594
Citations number
12
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
78
Issue
17
Year of publication
2001
Pages
2592 - 2594
Database
ISI
SICI code
0003-6951(20010423)78:17<2592:LSPMOS>2.0.ZU;2-W
Abstract
The operation of a cryogenic scanning force microscope is demonstrated with a sensitivity of about 50 fN/root Hz at 5 kHz modulation. This microscope is used as an electrometer in noncontact mode in order to map the local ele ctrostatic forces and capacitance of several nanostructures at 4.2 K. Capac itance imaging of nanostructured surfaces with subatto-Farad resolution is demonstrated. (C) 2001 American Institute of Physics.