The critical current density and n-values on four types of Bi2Sr2Ca2CuOx ta
pes have been studied from 40 K to the critical temperature. The results sh
owed that the critical current density appears in three periods with decrea
sing temperature. Compared to Ag alloy-sheathed tapes, the critical current
density of AE-sheathed tape is more affected by temperature. It also appea
red that n-values have a maximized value near the temperature of liquid nit
rogen. When the temperature is lower than 60 K. although the critical curre
nt density still shows apparent improvement, n-values are very low. (C) 200
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