Thermally stimulated current observation of trapping centers in undoped GaSe layered single crystals

Undoped p-GaSe layered single crystals wet e grown using Bridgman technique . Thermally stimulated current measurements in the temperature range of 10- 300 K were performed at a heating rate of 0.18 K/s. The analysis of the dat a revealed three trap levels at 0.02. 0.10 and 0.26 eV. The calculation for these traps yielded 8.8 x 10(-27), 1.9 x 10(-25). and 3.2 x 10(-21) cm(2) for capture cross sections and 3.2 x 10(14) 1.1 x 10(16) and 1.2 x 10(16) c m(-3) for the concentrations, respectively.