Transmission electron microscopical studies of the layered structure of the ternary semiconductor CuIn5Se8

Authors
Tham, AT Su, DS Neumann, W Schubert-Bischoff, P Beilharz, C Benz, KW
Citation
At. Tham et al., Transmission electron microscopical studies of the layered structure of the ternary semiconductor CuIn5Se8, CRYST RES T, 36(3), 2001, pp. 303-308
Citations number
9
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
CRYSTAL RESEARCH AND TECHNOLOGY
ISSN journal
02321300 → ACNP
Volume
36
Issue
3
Year of publication
2001
Pages
303 - 308
Database
ISI
SICI code
0232-1300(2001)36:3<303:TEMSOT>2.0.ZU;2-N
Abstract
The structure of the off-stoichiometric In-rich ternary phase CuIn5Se8 was studied by means of electron diffraction and high-resolution electron micro scopy. The compound shows a layered structure with a 7-layer stacking seque nce of closed-packed planes, which contains both cubit: and hexagonal stack ing of Se atoms. The studied CuIn5Se8 bulk crystal is known as the beta -ph ase of this compound.